PHI Quantera II™

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The PHI Quantera II is an XPS instrument which can produce a micro-focused, raster scanned x-ray beam with a minimum beam size of 7.5 μm in diameter.

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Description

The PHI Quantera II is an XPS instrument which can produce a micro-focused, raster scanned x-ray beam with a minimum beam size of 7.5 μm in diameter.

In addition to superior micro area performance, the PHI Quantera II offers high throughput automated analysis and depth profiling.

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